Wire grid arrays, including Aluminum nano-structured lines on glass substrates, have been used as light polarizers for the past two decades. Traditionally Reliability studies have been conducted using standard reliability equipment such as isothermal ovens, humidity chambers, or carbon arc light sources which mimic the spectrum found from sunlight. These failure mechanisms are fairly well behaved and predictable. Recent developments of absorptive layers used in conjunction with the nano-structured lines coupled with high intensity, high flux, light sources are generating new morphologies and mechanisms for failure that are highly system design dependent and not well behaved. These new failure mechanisms require new tests and models for failure not seen in previous generations of the technology. This paper discusses our; approach, findings, and discussions on how to move forward in meeting customer requirements.