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2012 Workshop on Accelerated Stress Testing & Reliability

  Managing Reliability in a Dynamic Global Market 

October 17-19, 2012 
Toronto, Canada

ASTR 2012 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures.  The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market.  The program will feature industry leading keynote speakers and selected presentations.

 

   Call for presentations is now open

 

Submission Deadline:  April 30, 2012

 

Presentations are sought in, but are not limited to, the following major topics:

 

Re-Thinking and Re-Visiting Qualification Specs

§ Physics of failure, and how it is considered in the existing qualification standards

§ Do the industries need a new approach to qualify their products?

§ Qualification testing and its relationship with other types of accelerated testing

 

§ ASTR in Energy Efficient Hardware/Systems

§ Low power semiconductor devices, photovoltaics and LEDs

§ Durability assessment of Pb free solder & ROHS compliant packages, printed wiring boards

§ Energy Storage Systems-Batteries, Fuel Cells and Capacitor Technology.

§ Electrical machines and actuators

§ Avionics and Aerospace Systems

§ Military and Commercial Ground and Marine Transportation Systems

§ Power plants, distributed energy systems and utility interfaces in Smart Grid.

§ Solar, geothermal, wind, ocean and biomass power

§ Green Buildings and energy efficient constructions

§ Telecommunications and networked computation

§ Portable consumer electronics and Biomedical devices

§ Cradle to Cradle Design Framework

 

§ Accelerated Stress Testing & Field Failures

§ Improvements in test equipment and methodology for optimized test duration.

§ Acceleration factors

§ Latent failures screening methodology

§ No Fault Found Issues-Location and Elimination

§ COTS Components in military hardware/systems

§ MIL-SPEC design environment, testing of ruggedized systems

§ Mitigating the impact of obsolescence

 

§ Failure Analysis (FA) & Prognostics and Health Management (PHM)

§ Physics and Chemistry of degradation and failure mechanisms

§ Physics of Failure modeling in durability prediction

§ Fault isolation principles using specific degradation mechanisms

§ Failure Analysis tool development

§ FMEA

§ Sensors in PHM

§ PHM Standards and Methodologies

§ Data Driven and Model based prognostics

§ Case studies

 

§ Predictive Modeling & Field Failures

§ Systems level reliability and maintainability

§ Life Data Analysis, Field data use in repairable systems

§ Modeling and analysis of ageing systems

§ Risk assessments at product conception phase

§ Modeling and simulation using probabilistic methods

 

§ Product Robustness & Cost Control

§ Design for Reliability (DFR) and Design for Manufacturability (DFM)

§ Product Qualification and Quality Control

§ Material Procurement and Supplier Quality Issues

§ ASTR in lean manufacturing environments

§ Customer satisfaction management

§ Software systems in health care management
   

 

 

Instructions for submitting presentation abstracts

Abstracts should be submitted as a 1 page (or less) document in pdf format. The abstract should include sufficient information that would indicate clearly and concisely, the importance of the work and path towards development of the final presentation paper.

Abstracts should be sent directly to the Milena Krasich ( Milena_Krasich@raytheon.com ), with copies to the Don Gerstle ( don_gerstle@murata-ps.com ), Ephraim Suhir ( suhire@aol.com ), and Sambit Saha ( sambit.saha@baesystems.com .)

Abstracts should state the names, affiliations and contact information of all co-authors. The name of the presenting author should be underlined in the abstract.

The authors of accepted abstracts will provide their presentation paper and their biography documents after being notified about acceptance of the abstract. Templates for the presentation and author biography will become available at the ASTR 2012 website.  Accepted authors are strongly encouraged to send a draft copy of their presentation to the session chair and receive a feedback before preparing the final version of their presentation.

 

 

Important Dates:

     Presentation abstracts due: May 31st.
     First draft of presentation due: July 31.
     Final draft of presentation due: Sept 15.





Sponsored by the IEEE CPMT Society

         

Technically Co-Sponsored by
RS Society
DEIS
IEEE Dielectric and Electrical Insulation Society
ASQ
EMB

Engineering in Medicine and Biology Society of the IEEE

Also
Endorsed By
The American Physical Society
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